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Near-field effect of extended targets on absolute calibration of microwave sensors
Wu, J.; Jiang, J. S.
Department国家863计划微波遥感技术实验室
Source PublicationIgarss '96 - 1996 international geoscience and remote sensing symposium: remote sensing for a sustainable future, vols i - iv
1996
Pages739-742
Language英语
ISBN0-7803-3069-2
AbstractThe near-field effect of extended target, i.e. the illuminated ground area of an active microwave sensor, is dscussed. It is shown by both analysis and numerical examples that all measurements are taken in the near-field and the value of normalized backscattering coeffcients are varytng periodically even for a uniformly dstributed scattenng characteristics target whde the platform altitude is increasmg. In order to compensate t h ~ s variation, a practical platform relocation techtllque is proposed
Conference Name1996 International Geoscience and Remote Sensing Symposium (IGARSS 96) - Remote Sensing for a Sustainable Future
Conference Date1996
Conference PlaceLincoln, Ne
Indexed ByCPCI
Document Type会议论文
Identifierhttp://ir.nssc.ac.cn/handle/122/1743
Collection微波遥感部
Recommended Citation
GB/T 7714
Wu, J.,Jiang, J. S.. Near-field effect of extended targets on absolute calibration of microwave sensors[C]. NEW YORK:IEEE,1996:739-742.
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1996739742.pdf(386KB)会议论文 开放获取CC BY-NC-SAApplication Full Text
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