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一种单粒子效应探测装置及方法
Application NumberCN200910086516.1
韩建伟; 马英起; 封国强; 安广鹏; 张振龙
2010
Application Date2009-06-04
Date Available2010-12-08
Country中国
Abstract本发明提供一种单粒子效应探测装置,包括光耦传感器工作单元、SET幅度甄别单元额和SET计数单元;所述光耦传感器工作单元用于在待测辐射环境中获取SET信号,所述SET幅度甄别单元用于将光耦传感器工作单元获取的SET信号幅度与阈电压进行对比后甄别出不同的SET信号的幅度范围,所述SET计数单元用于统计处于各幅度区间的SET信号的出现次数。本发明还可以进一步包括数据映射单元。本发明能够实现对数个、十余个MeV.cm2/mg?LET的值甚至该量级以下的辐射环境的测量;能够定量测量表征特定微电子器件单粒子效应的LET值;具有较宽的LET值定量测量范围;并且所使用的传感器体积和质量小,电路结构简单,利于探测装置器件的轻小型化和低功耗化。
Language中文
Document Type专利
Identifierhttp://ir.nssc.ac.cn/handle/122/2164
Collection保障部/保障与试验验证中心
Recommended Citation
GB/T 7714
韩建伟,马英起,封国强,等. 一种单粒子效应探测装置及方法[P]. 2010-01-01.
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