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一种互补测量的单光子光谱计数成像系统及方法
Application NumberCN201210265370.9
翟光杰; 王超; 赵清; 俞文凯; 刘雪峰
2012
Application Date2012-07-27
Date Available2012-11-07
Country中国
Abstract本发明提供一种互补测量的单光子光谱计数成像系统及方法,该系统在可见光和近红外光范围内分别选取若干对应不同波长的单光子点探测单元组成两个线阵,和光谱分光部件一起分配到空间光调制器的两臂出射方向以便采样。该方法包括以下步骤:空间光调制器将成像在其上的光反射至两臂方向,分别准直分光,一臂取可见光光谱,一臂取近红外光光谱,由相应单光子探测器线阵进行探测。根据互补矩阵、计数值和通道所对应的波长信息,关联的压缩传感算法可重建出可见光和近红外光彩色图像,统计出波长—光功率的光谱图以便光谱分析。本发明解决了现有成像光谱仪器无法同时探测可见光和近红外光光谱的问题,具有低维度、高通量、高灵敏度、高分辨率等优点。
Language中文
Document Type专利
Identifierhttp://ir.nssc.ac.cn/handle/122/2289
Collection空间技术部
Recommended Citation
GB/T 7714
翟光杰,王超,赵清,等. 一种互补测量的单光子光谱计数成像系统及方法[P]. 2012-01-01.
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