| Pulsed laser method for SEE testing in FPGAs | |
| Jiang, Yu-Guang; Feng, Guo-Qiang; Zhu, Xiang; Shangguan, Shi-Peng; Ma, Ying-Qi; Han, Jian-Wei; 北京8701信箱 | |
| Department | 保障部/保障与试验验证中心 |
| Source Publication | Yuanzineng Kexue Jishu/Atomic Energy Science and Technology
 |
| 2012 | |
| Volume | 46Issue:SUPPL. 1Pages:582-586 |
| ISSN | 1000-6931 |
| Language | 中文 |
| Abstract | The pulsed laser method for studying single event effect (SEE) in Virtex-2 FPGA was discussed, and the validity of laser stimulated SEE was evaluated. The laser focusing depth and laser fluence have important impact on the cross section of device under test. With high pulse energy, a single laser pulse could induce multiple-bit upsets (MBU). During irradiation of pulsed laser, the current of chip is increased by 1-2 mA and the chip works normally. A comparison between the results of heavy ion and pulsed laser shows that pulsed laser is valid to simulate SEE like heavy-ion. |
| Indexed By | EI |
| Funding Project | 中国科学院空间科学与应用研究中心 |
| Document Type | 期刊论文 |
| Identifier | http://ir.nssc.ac.cn/handle/122/2859 |
| Collection | 保障部/保障与试验验证中心 |
| Corresponding Author | 北京8701信箱 |
| Recommended Citation GB/T 7714 | Jiang, Yu-Guang,Feng, Guo-Qiang,Zhu, Xiang,et al. Pulsed laser method for SEE testing in FPGAs[J]. Yuanzineng Kexue Jishu/Atomic Energy Science and Technology,2012,46(SUPPL. 1):582-586. |
| APA | Jiang, Yu-Guang.,Feng, Guo-Qiang.,Zhu, Xiang.,Shangguan, Shi-Peng.,Ma, Ying-Qi.,...&北京8701信箱.(2012).Pulsed laser method for SEE testing in FPGAs.Yuanzineng Kexue Jishu/Atomic Energy Science and Technology,46(SUPPL. 1),582-586. |
| MLA | Jiang, Yu-Guang,et al."Pulsed laser method for SEE testing in FPGAs".Yuanzineng Kexue Jishu/Atomic Energy Science and Technology 46.SUPPL. 1(2012):582-586. |
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