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Pulsed laser method for SEE testing in FPGAs
Jiang, Yu-Guang; Feng, Guo-Qiang; Zhu, Xiang; Shangguan, Shi-Peng; Ma, Ying-Qi; Han, Jian-Wei; 北京8701信箱
Department保障部/保障与试验验证中心
Source PublicationYuanzineng Kexue Jishu/Atomic Energy Science and Technology
2012
Volume46Issue:SUPPL. 1Pages:582-586
ISSN1000-6931
Language中文
AbstractThe pulsed laser method for studying single event effect (SEE) in Virtex-2 FPGA was discussed, and the validity of laser stimulated SEE was evaluated. The laser focusing depth and laser fluence have important impact on the cross section of device under test. With high pulse energy, a single laser pulse could induce multiple-bit upsets (MBU). During irradiation of pulsed laser, the current of chip is increased by 1-2 mA and the chip works normally. A comparison between the results of heavy ion and pulsed laser shows that pulsed laser is valid to simulate SEE like heavy-ion.
Indexed ByEI
Funding Project中国科学院空间科学与应用研究中心
Document Type期刊论文
Identifierhttp://ir.nssc.ac.cn/handle/122/2859
Collection保障部/保障与试验验证中心
Corresponding Author北京8701信箱
Recommended Citation
GB/T 7714
Jiang, Yu-Guang,Feng, Guo-Qiang,Zhu, Xiang,et al. Pulsed laser method for SEE testing in FPGAs[J]. Yuanzineng Kexue Jishu/Atomic Energy Science and Technology,2012,46(SUPPL. 1):582-586.
APA Jiang, Yu-Guang.,Feng, Guo-Qiang.,Zhu, Xiang.,Shangguan, Shi-Peng.,Ma, Ying-Qi.,...&北京8701信箱.(2012).Pulsed laser method for SEE testing in FPGAs.Yuanzineng Kexue Jishu/Atomic Energy Science and Technology,46(SUPPL. 1),582-586.
MLA Jiang, Yu-Guang,et al."Pulsed laser method for SEE testing in FPGAs".Yuanzineng Kexue Jishu/Atomic Energy Science and Technology 46.SUPPL. 1(2012):582-586.
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