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A puncturing scheme for low-density parity-check codes based on 1-SR nodes
Zhang, Lijun; Ma, Fuli; Cheng, L.L.; Zhang, L. (ljzhang@bjtu.edu.cn)
Department运控部/科学卫星综合运控中心
Source PublicationIEEE Vehicular Technology Conference
2012
Language英语
ISSN1550-2252
ISBN9781467318815
AbstractA rate-compatible puncturing scheme for LDPC codes is proposed based on the fact that a one-step recoverable (1-SR) node is more reliable than a k-SR node (k>$) and a 1-SR node with more survived check nodes can be recovered more reliably in a recovery tree, so the scheme tries to obtain 1-SR nodes which have multiple survived check nodes as many as possible. Simulation results show that the puncturing scheme has better performance than both the random puncturing scheme and the novel method in [5]. © 2012 IEEE.; A rate-compatible puncturing scheme for LDPC codes is proposed based on the fact that a one-step recoverable (1-SR) node is more reliable than a k-SR node (k>$) and a 1-SR node with more survived check nodes can be recovered more reliably in a recovery tree, so the scheme tries to obtain 1-SR nodes which have multiple survived check nodes as many as possible. Simulation results show that the puncturing scheme has better performance than both the random puncturing scheme and the novel method in [5]. © 2012 IEEE.
Conference Name76th IEEE Vehicular Technology Conference, VTC Fall 2012
Conference DateSeptember 3, 2012 - September 6, 2012
Conference PlaceQuebec City, QC, Canada
Indexed ByEI
Document Type会议论文
Identifierhttp://ir.nssc.ac.cn/handle/122/3463
Collection运控部/科学卫星综合运控中心
Corresponding AuthorZhang, L. (ljzhang@bjtu.edu.cn)
Recommended Citation
GB/T 7714
Zhang, Lijun,Ma, Fuli,Cheng, L.L.,et al. A puncturing scheme for low-density parity-check codes based on 1-SR nodes[C]:Institute of Electrical and Electronics Engineers Inc., 445 Hoes Lane / P.O. Box 1331, Piscataway, NJ 08855-1331, United States,2012.
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