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脉冲激光和重离子辐照FPGA产生的多位翻转效应的比较
Alternative TitleComparison of multi-bit upset in FPGA induced by pulsed laser and heavy ions
封国强; 姜昱光; 朱翔; 韩建伟
Department保障部/保障与试验验证中心
Source Publication原子能科学技术
2014
Volume48Issue:增刊1Pages:732-736
ISSN1000-6931
Language中文
KeywordFpga 多位翻转 脉冲激光
Abstract以SRAM型FPGA为试验对象,研究脉冲激光模拟重离子产生单粒子多位翻转效应的可行性。FPGA的多位翻转依据其物理位置关系的不同分为3种类型:同帧同字节、同帧相邻字节和相邻帧。针对Virtex-Ⅱ FPGA分别进行脉冲激光与重离子的单粒子多位翻转效应的测试,对比脉冲激光和重离子在Virtex-Ⅱ FPGA产生多位翻转的类型、多位翻转的物理位置关系。结果表明,脉冲激光触发的Virtex-Ⅱ FPGA的多位翻转物理位置关系与重离子相同,对比脉冲激光与重离子的饱和翻转截面发现,应用脉冲激光和重离子得到的Virtex-Ⅱ饱和翻转截面基本一致,表明脉冲激光可模拟重离子研究Virtex-Ⅱ FPGA的多位翻转效应。
Other AbstractThe testing method of multi-bit upset in SRAM FPGA by pulsed laser was investigated. There are three types of multi-bit upsets according to physical location in FPGA, such as one byte in one frame, adjacent bytes in one frame and adjacent frames. Virtex-II FPGA were irradiated by pulsed laser and heavy ions, and the species and relative positions for multi-bit upset were obtained. The relative physical positions of multi-bit upset induced by pulsed laser and heavy ions are same. The saturation cross-sections of multi-bit upset induced by pulsed laser and heavy ions are consistent. The pulsed laser testing is fit for the investigation of multi-bit upset in FPGA.
Indexed ByEI
Document Type期刊论文
Identifierhttp://ir.nssc.ac.cn/handle/122/4372
Collection保障部/保障与试验验证中心
Recommended Citation
GB/T 7714
封国强,姜昱光,朱翔,等. 脉冲激光和重离子辐照FPGA产生的多位翻转效应的比较[J]. 原子能科学技术,2014,48(增刊1):732-736.
APA 封国强,姜昱光,朱翔,&韩建伟.(2014).脉冲激光和重离子辐照FPGA产生的多位翻转效应的比较.原子能科学技术,48(增刊1),732-736.
MLA 封国强,et al."脉冲激光和重离子辐照FPGA产生的多位翻转效应的比较".原子能科学技术 48.增刊1(2014):732-736.
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