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Alternative TitlePulsed laser method for SEE testing in FPGAs
姜昱光; 封国强; 朱翔; 上官士鹏; 马英起; 韩建伟
Source Publication原子能科学技术
Volume46Issue:SUPPL. 1Pages:582-586
Keyword脉冲激光 单粒子效应 Fpga 多位翻转 翻转截面
Other AbstractThe pulsed laser method for studying single event effect (SEE) in Virtex-2 FPGA was discussed, and the validity of laser stimulated SEE was evaluated. The laser focusing depth and laser fluence have important impact on the cross section of device under test. With high pulse energy, a single laser pulse could induce multiple-bit upsets (MBU). During irradiation of pulsed laser, the current of chip is increased by 1-2 mA and the chip works normally. A comparison between the results of heavy ion and pulsed laser shows that pulsed laser is valid to simulate SEE like heavy-ion.
Indexed ByEI
Document Type期刊论文
Recommended Citation
GB/T 7714
姜昱光,封国强,朱翔,等. FPGA单粒子效应的脉冲激光试验方法研究[J]. 原子能科学技术,2012,46(SUPPL. 1):582-586.
APA 姜昱光,封国强,朱翔,上官士鹏,马英起,&韩建伟.(2012).FPGA单粒子效应的脉冲激光试验方法研究.原子能科学技术,46(SUPPL. 1),582-586.
MLA 姜昱光,et al."FPGA单粒子效应的脉冲激光试验方法研究".原子能科学技术 46.SUPPL. 1(2012):582-586.
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