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A Focal Plane Metrology System and PSF Centroiding Experiment
Li, Haitao; Li, Baoquan; Cao, Yang; Li, Ligang; Li, HT (reprint author), Chinese Acad Sci, Natl Space Sci Ctr, Beijing, Peoples R China.
Department空间技术部
Source PublicationOPTICAL MEASUREMENT TECHNOLOGY AND INSTRUMENTATION
2016
Language英语
ISSN0277-786X
ISBN978-1-5106-0769-9
AbstractIn this paper, we present an overview of a detector array equipment metrology testbed and a micro-pixel centroiding experiment currently under development at the National Space Science Center, Chinese Academy of Sciences. We discuss on-going development efforts aimed at calibrating the intra-/inter-pixel quantum efficiency and pixel positions for scientific grade CMOS detector, and review significant progress in achieving higher precision differential centroiding for pseudo star images in large area back-illuminated CMOS detector. Without calibration of pixel positions and intrapixel response, we have demonstrated that the standard deviation of differential centroiding is below 2.0e-3 pixels.
KeywordStep Exoplanets Centroiding Photon Weighted Means Gauss Fitting Fourier Resampling
Conference NameInternational Symposium on Optical Measurement Technology and Instrumentation
Conference DateMAY 09-11, 2016
Conference PlaceBeijing, PEOPLES R CHINA
Indexed ByEI ; CPCI
Document Type会议论文
Identifierhttp://ir.nssc.ac.cn/handle/122/5795
Collection空间技术部
Corresponding AuthorLi, HT (reprint author), Chinese Acad Sci, Natl Space Sci Ctr, Beijing, Peoples R China.
Recommended Citation
GB/T 7714
Li, Haitao,Li, Baoquan,Cao, Yang,et al. A Focal Plane Metrology System and PSF Centroiding Experiment[C],2016.
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