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题名: A case study of failure analysis and root cause identification on ESD-induced breakdown
作者: Liu, Hongmin; Li, Zhe; Weng, Zheng
作者部门: 保障部/保障与试验验证中心
会议名称: 42nd International Symposium for Testing and Failure Analysis, ISTFA 2016
会议日期: November 6, 2016 - November 10, 2016
会议地点: Fort Worth, TX, United states
会议录: Conference Proceedings from the International Symposium for Testing and Failure Analysis
出版日期: 2016
收录类别: EI
页码: 291-293
ISBN号: 9781627081351
语种: 英语
内容类型: 会议论文
URI标识: http://ir.nssc.ac.cn/handle/122/5853
Appears in Collections:保障部/保障与试验验证中心_会议论文

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