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A case study of failure analysis and root cause identification on ESD-induced breakdown
Liu, Hongmin; Li, Zhe; Weng, Zheng
Department保障部/保障与试验验证中心
Source PublicationConference Proceedings from the International Symposium for Testing and Failure Analysis
2016
Pages291-293
Language英语
ISBN9781627081351
Conference Name42nd International Symposium for Testing and Failure Analysis, ISTFA 2016
Conference DateNovember 6, 2016 - November 10, 2016
Conference PlaceFort Worth, TX, United states
Indexed ByEI ; CPCI
Document Type会议论文
Identifierhttp://ir.nssc.ac.cn/handle/122/5853
Collection保障部/保障与试验验证中心
Recommended Citation
GB/T 7714
Liu, Hongmin,Li, Zhe,Weng, Zheng. A case study of failure analysis and root cause identification on ESD-induced breakdown[C],2016:291-293.
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