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Comparison of single-event upset generated by heavy ion and pulsed laser
Liang, Bin; Song, Ruiqiang; Han, Jianwei; Chi, Yaqing; Chen, Rui; Hu, Chunmei; Chen, Jianjun; Ma, Yingqi; Shangguan, Shipeng; Liang, Bin (liangbin110@126.com)
作者部门保障部/保障与试验验证中心
发表期刊Science China Information Sciences
2017
卷号60期号:7
ISSN1674-733X
语种英语
摘要Single-event upset (SEU) is investigated using heavy ion and pulsed laser. The measured SEU cross sections of D and DICE flip-flops are compared. Measurement results indicate pulsed laser is capable of inducing similar SEU to those induced by heavy ion. 3D-TCAD simulation is performed to investigate the factors to impact pulsed laser induced SEU. Simulation results show that the beam spot size significantly impacts SEU cross sections in both low and high laser energy while the variation of the equivalent LET only impacts SEU cross sections in the low laser energy. © 2017, Science China Press and Springer-Verlag GmbH Germany.
收录类别SCI ; EI
文献类型期刊论文
条目标识符http://ir.nssc.ac.cn/handle/122/5948
专题保障部/保障与试验验证中心
通讯作者Liang, Bin (liangbin110@126.com)
推荐引用方式
GB/T 7714
Liang, Bin,Song, Ruiqiang,Han, Jianwei,et al. Comparison of single-event upset generated by heavy ion and pulsed laser[J]. Science China Information Sciences,2017,60(7).
APA Liang, Bin.,Song, Ruiqiang.,Han, Jianwei.,Chi, Yaqing.,Chen, Rui.,...&Liang, Bin .(2017).Comparison of single-event upset generated by heavy ion and pulsed laser.Science China Information Sciences,60(7).
MLA Liang, Bin,et al."Comparison of single-event upset generated by heavy ion and pulsed laser".Science China Information Sciences 60.7(2017).
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