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Comparison of single-event upset generated by heavy ion and pulsed laser
Liang, Bin; Song, Ruiqiang; Han, Jianwei; Chi, Yaqing; Chen, Rui; Hu, Chunmei; Chen, Jianjun; Ma, Yingqi; Shangguan, Shipeng; Liang, Bin (liangbin110@126.com)
Department保障部/保障与试验验证中心
Source PublicationScience China Information Sciences
2017
Volume60Issue:7
ISSN1674-733X
Language英语
AbstractSingle-event upset (SEU) is investigated using heavy ion and pulsed laser. The measured SEU cross sections of D and DICE flip-flops are compared. Measurement results indicate pulsed laser is capable of inducing similar SEU to those induced by heavy ion. 3D-TCAD simulation is performed to investigate the factors to impact pulsed laser induced SEU. Simulation results show that the beam spot size significantly impacts SEU cross sections in both low and high laser energy while the variation of the equivalent LET only impacts SEU cross sections in the low laser energy. © 2017, Science China Press and Springer-Verlag GmbH Germany.
Indexed BySCI ; EI
Document Type期刊论文
Identifierhttp://ir.nssc.ac.cn/handle/122/5948
Collection保障部/保障与试验验证中心
Corresponding AuthorLiang, Bin (liangbin110@126.com)
Recommended Citation
GB/T 7714
Liang, Bin,Song, Ruiqiang,Han, Jianwei,et al. Comparison of single-event upset generated by heavy ion and pulsed laser[J]. Science China Information Sciences,2017,60(7).
APA Liang, Bin.,Song, Ruiqiang.,Han, Jianwei.,Chi, Yaqing.,Chen, Rui.,...&Liang, Bin .(2017).Comparison of single-event upset generated by heavy ion and pulsed laser.Science China Information Sciences,60(7).
MLA Liang, Bin,et al."Comparison of single-event upset generated by heavy ion and pulsed laser".Science China Information Sciences 60.7(2017).
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