NSSC OpenIR  > 保障部/保障与试验验证中心
一种密码芯片的安全检测方法及其装置
Application Number

2017114412388

朱翔;  韩建伟;  马英起;  上官士鹏;  李悦
2017-12-27
Application Date2017-12-27
Date Available2018-06-15
Country中国
Language中文
IPC Classification NumberH04l9/08(2006.01)i ;  h04l9/00(2006.01)i ;  g01r31/308(2006.01)i ;  h04l12/26(2006.01)i
Document Type专利
Identifierhttp://ir.nssc.ac.cn/handle/122/6812
Collection保障部/保障与试验验证中心
Affiliation中国科学院国家空间科学中心
Recommended Citation
GB/T 7714
朱翔, 韩建伟, 马英起,等. 一种密码芯片的安全检测方法及其装置[P]. 2017-12-27.
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2017114412388.pdf(1516KB)专利 开放获取CC BY-NC-SAApplication Full Text
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