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Focused Ion Beam (FIB) and Microtome Combined Ultrathin Slice Preparation for Transmission Electron Microscopy (TEM) Observation
Xu, Yuchen; Gu, Lixin; Li, Yang; Mo, Bing; Lin, Yangting
Department空间科学部
Source PublicationMETEORITICS & PLANETARY SCIENCE
2019
Volume54
ISSN1086-9379
Language英语
Indexed BySCI
Document Type期刊论文
Identifierhttp://ir.nssc.ac.cn/handle/122/7068
Collection空间科学部
Recommended Citation
GB/T 7714
Xu, Yuchen,Gu, Lixin,Li, Yang,et al. Focused Ion Beam (FIB) and Microtome Combined Ultrathin Slice Preparation for Transmission Electron Microscopy (TEM) Observation[J]. METEORITICS & PLANETARY SCIENCE,2019,54.
APA Xu, Yuchen,Gu, Lixin,Li, Yang,Mo, Bing,&Lin, Yangting.(2019).Focused Ion Beam (FIB) and Microtome Combined Ultrathin Slice Preparation for Transmission Electron Microscopy (TEM) Observation.METEORITICS & PLANETARY SCIENCE,54.
MLA Xu, Yuchen,et al."Focused Ion Beam (FIB) and Microtome Combined Ultrathin Slice Preparation for Transmission Electron Microscopy (TEM) Observation".METEORITICS & PLANETARY SCIENCE 54(2019).
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