Focused Ion Beam (FIB) and Microtome Combined Ultrathin Slice Preparation for Transmission Electron Microscopy (TEM) Observation | |
Xu, Yuchen; Gu, Lixin; Li, Yang; Mo, Bing; Lin, Yangting | |
Department | 空间科学部 |
Source Publication | METEORITICS & PLANETARY SCIENCE
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2019 | |
Volume | 54 |
ISSN | 1086-9379 |
Language | 英语 |
Indexed By | SCI |
Document Type | 期刊论文 |
Identifier | http://ir.nssc.ac.cn/handle/122/7068 |
Collection | 空间科学部 |
Recommended Citation GB/T 7714 | Xu, Yuchen,Gu, Lixin,Li, Yang,et al. Focused Ion Beam (FIB) and Microtome Combined Ultrathin Slice Preparation for Transmission Electron Microscopy (TEM) Observation[J]. METEORITICS & PLANETARY SCIENCE,2019,54. |
APA | Xu, Yuchen,Gu, Lixin,Li, Yang,Mo, Bing,&Lin, Yangting.(2019).Focused Ion Beam (FIB) and Microtome Combined Ultrathin Slice Preparation for Transmission Electron Microscopy (TEM) Observation.METEORITICS & PLANETARY SCIENCE,54. |
MLA | Xu, Yuchen,et al."Focused Ion Beam (FIB) and Microtome Combined Ultrathin Slice Preparation for Transmission Electron Microscopy (TEM) Observation".METEORITICS & PLANETARY SCIENCE 54(2019). |
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