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一种基于碳膜二次电子产额的原子鉴别系统及方法
Application NumberCN202010806017.1
常远; 余庆龙; 路立; 荆涛; 卢琪; 孙越强
2020
Application Date2020
Date Available2020
Country中国
Document Type专利
Identifierhttp://ir.nssc.ac.cn/handle/122/7309
Collection中国科学院国家空间科学中心
Affiliation中国科学院国家空间科学中心
Recommended Citation
GB/T 7714
常远,余庆龙,路立,等. 一种基于碳膜二次电子产额的原子鉴别系统及方法[P]. 2020-01-01.
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