一种基于碳膜二次电子产额的原子鉴别系统及方法

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	一种基于碳膜二次电子产额的原子鉴别系统及方法
Application Number	CN202010806017.1
	常远; 余庆龙; 路立; 荆涛; 卢琪; 孙越强
	2020
Application Date	2020
Date Available	2020
Country	中国
Document Type	专利
Identifier	http://ir.nssc.ac.cn/handle/122/7309
Collection	中国科学院国家空间科学中心
Affiliation	中国科学院国家空间科学中心
Recommended Citation GB/T 7714	常远,余庆龙,路立,等. 一种基于碳膜二次电子产额的原子鉴别系统及方法[P]. 2020-01-01.

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