NSSC OpenIR
一种星载电子元器件的辐照特性的评价方法及评价系统
Application NumberCN202010652260.2
刘红民
2020
Application Date2020
Date Available2020
Country中国
Document Type专利
Identifierhttp://ir.nssc.ac.cn/handle/122/7323
Collection中国科学院国家空间科学中心
Affiliation中国科学院国家空间科学中心
Recommended Citation
GB/T 7714
刘红民. 一种星载电子元器件的辐照特性的评价方法及评价系统[P]. 2020-01-01.
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