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一种基于二单元扫描干涉仪的自定标近场成像方法及其系统
Application NumberCN202010355679.1
周燕晖; 刘浩; 张成; 王馨悦; 郑晓亮
2020
Application Date2020
Date Available2020
Country中国
Document Type专利
Identifierhttp://ir.nssc.ac.cn/handle/122/7346
Collection中国科学院国家空间科学中心
Affiliation中国科学院国家空间科学中心
Recommended Citation
GB/T 7714
周燕晖,刘浩,张成,等. 一种基于二单元扫描干涉仪的自定标近场成像方法及其系统[P]. 2020-01-01.
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