NSSC OpenIR
Complex Permittivity Measurement of Dielectric Substrate in Sub-THz Range
Alternative Title20204709518009
Zhu, Hao-Tian1; Wu, Ke2
Source PublicationIEEE Transactions on Terahertz Science and Technology
2020
DOI10.1109/TTHZ.2020.3036181
ISSN2156342X
Language英语
KeywordDielectric materials - Mirrors - Permittivity - Permittivity measurement - Polychlorinated biphenyls - Silicon wafers - Substrates Closed-form expression - Complex permittivity measurement - Dielectric substrates - Frequency independent - Measurement uncertainty - Multiple reflections - Relative permittivity - Transmission parameters
AbstractIn this paper, three frequency independent optical paths are designed and analyzed. A two-parabolic-mirror system and a four-parabolic-mirror system are studied and developed over 140-220 GHz to achieve precision complex permittivity measurements of dielectric substrate. To achieve a wide plane wave zone for the center of the four-parabolic-mirror system, two 80-mm-length corrugated horns are designed and fabricated for the measurement systems. The Gaussicity of the corrugated horn is larger than 97.4%. For the multiple reflection model and direct wave model, two closed-form expressions of loss tangent are derived from the transmission parameters (insertion losses) of the measurement systems. Meanwhile, the resolution and uncertainty of loss tangent can be calculated according to the working frequency, thickness of the wafer, real part of the relative permittivity, and the ${|S_{21}|}$ measurement uncertainty. The complex permittivity of the Rogers/duroid series PCB substrates, which are commonly used at microwave frequencies, and silicon wafers are measured in G-band. IEEE
Indexed ByEI
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Document Type期刊论文
Identifierhttp://ir.nssc.ac.cn/handle/122/7475
Collection中国科学院国家空间科学中心
Affiliation1.Key Laboratory of Microwave Remote Sensing, National Space Science Center Chinese Academy of Sciences, 53016 Beijing, Beijing China (e-mail: zhuhaotian_2007@126.com);
2.Electrical Engineering, Ecole Polytechnique de Montreal, 5596 Montreal, Quebec Canada (e-mail: ke.wu@polymtl.ca)
Recommended Citation
GB/T 7714
Zhu, Hao-Tian,Wu, Ke. Complex Permittivity Measurement of Dielectric Substrate in Sub-THz Range[J]. IEEE Transactions on Terahertz Science and Technology,2020.
APA Zhu, Hao-Tian,&Wu, Ke.(2020).Complex Permittivity Measurement of Dielectric Substrate in Sub-THz Range.IEEE Transactions on Terahertz Science and Technology.
MLA Zhu, Hao-Tian,et al."Complex Permittivity Measurement of Dielectric Substrate in Sub-THz Range".IEEE Transactions on Terahertz Science and Technology (2020).
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