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Comparative Study on the Transients Induced by Single Event Effect and Space Electrostatic Discharge
Alternative TitleWOS:000505499000021
Chen, R.; Chen, L.; Li, S.; Zhu, X.; Han, J-W
Source PublicationIEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY
2019
Volume19Issue:4Pages:733-740
DOI10.1109/TDMR.2019.2950929
ISSN1530-4388
Language英语
KeywordTransient analysis Transistors Space vehicles Integrated circuit modeling Electrostatic discharges Power supplies Extraterrestrial phenomena Transients single event effect space electrostatic discharge effect comparison physical mechanisms-OPERATIONAL-AMPLIFIER LM124 SETS
AbstractSpace radiation-induced Single Event Effect (SEE) and Space Electrostatic Discharge (SESD) are two significant phenomena which cause spacecraft anomalies. However, it is difficult to differentiate between them when trying to identify the root causes of the on-orbit anomalies. This paper pioneers the study of similarities and difference between transients induced by SEE and those induced by SESD. The work is done with the LM124, a well-known operational amplifier. The physical mechanisms between the transients induced by SEE and SESD are studied using H-SPICE simulations. The characteristics of the transient waveforms and the relationship with an external stimulus between SEE and SESD are further investigated with a pulsed laser SEE facility and SESD test system, respectively. The results show that similar transient waveforms can be generated at the device output by both SEE and SESD, while bipolar transients are found only in SEE testing. The different output transient signatures could be used to identify the root causes of spacecraft anomalies.
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Document Type期刊论文
Identifierhttp://ir.nssc.ac.cn/handle/122/7523
Collection中国科学院国家空间科学中心
Affiliation1.[Chen, R.
2.Li, S.
3.Zhu, X.
4.Chinese Acad Sci, Natl Space Sci Ctr, Beijing 100190, Peoples R China
5.[Chen, R.] Univ Saskatchewan, Elect & Comp Engn, Saskatoon, SK S7N 5A9, Canada
6.[Chen, L.] Univ Saskatchewan, Dept Elect & Comp Engn, Saskatoon, SK S7N 5B5, Canada
Recommended Citation
GB/T 7714
Chen, R.,Chen, L.,Li, S.,et al. Comparative Study on the Transients Induced by Single Event Effect and Space Electrostatic Discharge[J]. IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY,2019,19(4):733-740.
APA Chen, R.,Chen, L.,Li, S.,Zhu, X.,&Han, J-W.(2019).Comparative Study on the Transients Induced by Single Event Effect and Space Electrostatic Discharge.IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY,19(4),733-740.
MLA Chen, R.,et al."Comparative Study on the Transients Induced by Single Event Effect and Space Electrostatic Discharge".IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY 19.4(2019):733-740.
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