NSSC OpenIR
Precise methods for distinguishing S-box faults in laser injection attacks
Alternative TitleWOS:000517832500008
Zhang, Fan3,4; Zhang, Yiran; Jiang, Huilong2; Zhu, Xiang2; Lin, Feng1; Ren, Kui1
Source PublicationELECTRONICS LETTERS
2019
Volume55Issue:25Pages:1333-1334
DOI10.1049/el.2019.2865
ISSN0013-5194
Language英语
Keywordcryptography microcontrollers laser injection target real-world attacks analysing methods S-box faults laser-based physical experiment precise methods laser injection attacks fault attack active attack computational faults common fault injection methods attacking substitution-permutation networks-ciphers advanced encryption standard ATmega163L microcontroller ciphertexts-
AbstractFault attack is a type of active attack which retrieves the secret key by injecting computational faults. Laser is one of the most common fault injection methods. When attacking substitution-permutation networks-ciphers, S-box is often chosen as the laser injection target. However, the adversary has to know whether the S-box is corrupted or not after each injection, which was difficult in real-world attacks. Two analysing methods to distinguish the S-box faults for different ciphers is proposed in this Letter. A laser-based physical experiment is carried out to verify the authors' methods on Advanced Encryption Standard and PRESENT ciphers on an ATmega163L microcontroller. Experimental results show that their methods can precisely distinguish S-box faults merely using dozens of ciphertexts.
Indexed BySCI
Citation statistics
Document Type期刊论文
Identifierhttp://ir.nssc.ac.cn/handle/122/7601
Collection中国科学院国家空间科学中心
Affiliation1.Zhejiang Univ, Coll Informat Sci & Elect Engn, Hangzhou, Zhejiang, Peoples R China
2.Zhejiang Univ, Coll Comp Sci & Technol, Hangzhou, Zhejiang, Peoples R China
3.Chinese Acad Sci, Natl Space Sci Ctr, Beijing 100864, Peoples R China
4.Zhejiang Univ, State Key Lab Cryptol, Alibaba Zhejiang Univ Joint Inst Frontier Technol, Zhejiang Lab, Hangzhou, Zhejiang, Peoples R China
5.Zhejiang Univ, Sch Cyber Sci & Technol, Hangzhou, Zhejiang, Peoples R China
Recommended Citation
GB/T 7714
Zhang, Fan,Zhang, Yiran,Jiang, Huilong,et al. Precise methods for distinguishing S-box faults in laser injection attacks[J]. ELECTRONICS LETTERS,2019,55(25):1333-1334.
APA Zhang, Fan,Zhang, Yiran,Jiang, Huilong,Zhu, Xiang,Lin, Feng,&Ren, Kui.(2019).Precise methods for distinguishing S-box faults in laser injection attacks.ELECTRONICS LETTERS,55(25),1333-1334.
MLA Zhang, Fan,et al."Precise methods for distinguishing S-box faults in laser injection attacks".ELECTRONICS LETTERS 55.25(2019):1333-1334.
Files in This Item:
There are no files associated with this item.
Related Services
Recommend this item
Bookmark
Usage statistics
Export to Endnote
Google Scholar
Similar articles in Google Scholar
[Zhang, Fan]'s Articles
[Zhang, Yiran]'s Articles
[Jiang, Huilong]'s Articles
Baidu academic
Similar articles in Baidu academic
[Zhang, Fan]'s Articles
[Zhang, Yiran]'s Articles
[Jiang, Huilong]'s Articles
Bing Scholar
Similar articles in Bing Scholar
[Zhang, Fan]'s Articles
[Zhang, Yiran]'s Articles
[Jiang, Huilong]'s Articles
Terms of Use
No data!
Social Bookmark/Share
All comments (0)
No comment.
 

Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.