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A case study of failure analysis and root cause identification on ESD-induced breakdown 会议论文
Conference Proceedings from the International Symposium for Testing and Failure Analysis, Fort Worth, TX, United states, November 6, 2016 - November 10, 2016
Authors:  Liu, Hongmin;  Li, Zhe;  Weng, Zheng
Favorite  |  View/Download:106/0  |  Submit date:2017/06/20
A case study of failure analysis on ESD-induced degradation of 405nm LD 会议论文
Conference Proceedings from the International Symposium for Testing and Failure Analysis, Portland, OR, United states, November 1, 2015 - November 5, 2015
Authors:  Liu, Hongmin;  Li, Zhe;  Weng, Zheng;  Jiang, Hao;  Shen, Yuanting
Favorite  |  View/Download:125/0  |  Submit date:2016/05/09